Step -1: Si substrate
Start with P- type substrate.
Step - 2: Oxidation
Exposing to high purity Oxygen and silicon at approx 1000oC in oxidation furnace.
Exposing to high purity Oxygen and silicon at approx 1000oC in oxidation furnace.
Photo resist is a light sensitive organic polymer softens when exposed to light.
Step - 4: Masking
Expose photo resist through N-well mask.
Expose photo resist through N-well mask.
Step -5: Removal of Photo resist
Photo resist are removed by treating the wafer with acid or base solution.
Photo resist are removed by treating the wafer with acid or base solution.
Step - 6: Acid Etching
SiO2 is selectively removed from areas of wafer that are not covered by photo resist by using hydrofluoric acid.
SiO2 is selectively removed from areas of wafer that are not covered by photo resist by using hydrofluoric acid.
Step - 7: Removal of Photo resist
Strip off the remaining photo resist.
Strip off the remaining photo resist.
Step - 8:Formation of N-well
N-well if formed with diffusion or ion implantation.
N-well if formed with diffusion or ion implantation.
Step - 9: Removal of SiO2
Strip off the remaining oxide using HF
Strip off the remaining oxide using HF
Step - 10: Polysilicon deposition
Deposit very thin layer of gate oxide using Chemical Vapor Deposition (CVD) process.
Step - 11: N-Diffusion
N-Diffusion forms nMos source, drain, and n-well contact.
Oxidation
Masking
Diffusion
Step - 12: P - Diffusion
Similar set of steps form p+diffusion regions for pmos source, drain and substrate contact.
Step - 13: Contact cuts
The devices are to be wired together.
Cover chip with thick field oxide.
Etch oxide where contact cuts are needed.
Step - 14: Metallization:
Sputter on aluminium over whole wafer.
Pattern to remove excess metal, leaving wires.