The MOS
transistor, also called MOSFET (Metal-Oxide-Semiconductor Field-Effect
Transistor) or IGFET (Insulated-Gate
Field-Effect Transistor)
is the most widely used semiconductor device and is at the heart of every
digital circuit. Without the MOSFET there would be no computer industry, no
digital telecommunication systems, no video games, no pocket calculators and no
digital wristwatches. MOS transistors are also increasingly used in analog
applications such as switched capacitor circuits, analog-to-digital converters,
and filters.
The
exponential progress of MOS technology is best illustrated by the evolution of
the number of MOS transistors integrated in a single memory chip or single
microprocessor, as a function of calendar year. Each memory cell of a dynamic
random-access memory (DRAM) contains a MOS transistor and a capacitor. This
exponential growth of integration density with time is known as Moore's law.
The
integration density of memory circuits is about 5 to 10 times higher than that
of logic circuits such as microprocessors because of the more repetitive layout
of transistors in memory chips. The increase in integration density is
essentially due to the reduction of transistor size.
There are two
types of MOS transistors: n-channel MOSFET, p- channel MOSFET.
N-channel MOSFET: The n-channel MOSFET in which current flow is due to electron transport, and the p-channel MOSFET in which holes are responsible for current flow. A circuit containing only n-channel devices is produced by an nMOS process.
N-channel MOSFET: The n-channel MOSFET in which current flow is due to electron transport, and the p-channel MOSFET in which holes are responsible for current flow. A circuit containing only n-channel devices is produced by an nMOS process.
P-channel MOSFET:
In a p-channel transistor an N-type substrate is used. The P-type drain is at a lower potential than the P-type source and the application of a negative bias to the gate enables the formation of a hole-enriched channel between source and drain. The metal-insulator semiconductor structure is often referred to as a "MIS" structure, where the "I" stands for the insulator. When the insulator is an oxide, it is called a "MOS" structure.
In a p-channel transistor an N-type substrate is used. The P-type drain is at a lower potential than the P-type source and the application of a negative bias to the gate enables the formation of a hole-enriched channel between source and drain. The metal-insulator semiconductor structure is often referred to as a "MIS" structure, where the "I" stands for the insulator. When the insulator is an oxide, it is called a "MOS" structure.
OPERATION OF N-CHANNEL MOSFET:
The basic
operation of the n-channel MOSFET is the following. We will first consider the
case where the gate voltage is equal to zero while the P type substrate and the
source are grounded The drain is connected to a positive voltage source for
instance). Since the source and the substrate are at the same potential there
is no current flow in the source-substrate junction. The drain-substrate
junction is reverse biased and except for a small negligible reverse leakage
current no current flows in that junction either. Under these conditions there
is no channel formation, and therefore, no current flow from source to drain. In
the second case a constant positive bias is applied to the gate. There is no
gate current since the metal electrode is dielectrically insulated from the
silicon. Because it is positively biased the gate electrode does, however,
attract electrons from the semiconductor, and a thin, electron rich layer forms
under the gate insulator. These electrons are supplied by the source and the
drain which, being N-type, are large reservoirs of electrons. The electron-rich
layer underneath the gate is called "channel". The N-type source and
the N-type drain are connected by the electron rich channel, and current is now
free to flow between source and drain. The effect of the gate voltage
controlling the concentration of electrons in the semiconductor through the
gate oxide is called "field effect". The bias on the gate creates an
electric field which can either induce or inhibit the formation of an
electron-rich region at the surface of the semiconductor. The terms
"source", "drain", "channel" and "gate"
come to mind quite naturally since the electrons originate at the source, flow through
the channel and are finally collected by the drain, the whole process being
controlled by the bias on the gate.
In the above equations "lamda" is Channel length modulation.
Body effect is major drawback of CMOS technology. This will effect when substrate or body not biased with source. There is PN-juction diode present in between substrate and source so this will effect the change of threshold voltage. in order to avoid this effect we have to give same potential to both substrate and source.
In Body effect when we give the supply voltage to the gate (+ ve) and source to (- ve) at this condition there will be formation of a diode in the reverse bias this will increase the depletion region this makes the decreasing the channel and the threshold voltage will also increases, so in order to maintain the channel we need to increase the gate voltage.
Due to this effect we are biasing the source and substrate to the same potential which will not allow the moment of depletion towards the gate by this the Threshold voltage will not be increased.
Channel Length Modulation :
To understand the Channel length modulation, first we need to know about pinch-off of the channel is introduced. The channel is formed by attraction of carriers to the gate and the current drawn through the channel is nearly a constant independent of drain voltage in saturation mode.
As the drain voltage increases, its control over the current extends further towards source, so the uninverted region expands towards the source, shortening the length of the channel region. The effect is called Channel Length Modulation. Because resistance is proportional to length, shortening the channel decreases its resistance, causing an increase in current with increase in drain bias for a MOSFET operating in saturation region.
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